The ContourX-200 Optical Profilometer provides the perfect blend of advanced characterization, customizable options, and ease of use for best-in-class fast, accurate, and repeatable non-contact 3D surface metrology. The gage-capable, small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities using a larger FOV 5 MP digital camera and new motorized XY stage. ContourX-200 also comes complete with Vision64®, the industry’s most advanced operation and analysis software. New VisionXpress™ provides an even easier to use interface and streamlined capabilities with access to an extensive library of pre-programmed filters and analyses for precision machined surfaces, thick films, semiconductor, ophthalmic, medical device, MEMS and tribology applications. Boasting unmatched Z-axis resolution and accuracy, the ContourX-200 provides all the industry recognized advantages of Bruker’s proprietary white light interferometry (WLI) technology without the limitations of conventional confocal microscopes and competing standard optical profilers.