Bruker’s Performech II Advanced Control Module provides the speed and precision necessary for rapid, reliable, and quantitative characterization to the low end of the nanoscale. Based on a state-of-the-art digital-signal-processor (DSP) with field-programmable-gate-array (FPGA) architecture, the Performech II delivers ultra-fast feedback control of user-definable test functions, data sampling rates, and data acquisition speeds. Combined with industry-leading force and displacement noise floor performance, the Performech II enables 500x faster nanoindentation testing (XPM) for fast, high-resolution nanomechanical property mapping. Fully integrated multi-technique control capabilities allow the Performech II to seamlessly operate multiple Hysitron transducers, piezo scanners, and dynamic signal generators (nanoDMA III) with maximized signal synchronicity. The Performech II's modular controller design with auxiliary data acquisition and hardware control capabilities provides unparalleled flexibility and upgradability in nanomechanical and nanotribology-based characterization.