Compared to its predecessor (e–FlashHR) the new e–FlashHD detector features an improved cooling system that decreases the CCD's dark current by a factor of four. Thus, the generated Kikuchi patterns are now of even better quality, i.e. higher signal/noise ratio.
The new e–FlashHD detector uses a high efficiency and high quality phosphor screen to acquire high detailed Kikuchi patterns. The combination of a high pixel resolution CCD chip and a small grain size phosphor material guarantees a final pixel size in the patterns of 20 μm making visible very small shifts in the patterns.
The high precision guiding system of the e–FlashHD allows for a screen positioning precision better than 10 μm. Therefore, the new e–FlashHD is the best solution for running the pattern center calibration using methods based on screen movement.
The e–FlashHD is available with ARGUS™ forescattered / backscattered electron imaging system. This further increases the versatility of the detector and provides valuable additional information for meaningful and efficient microstructure characterization.