Micro-XRF on SEM

PCB Analysis with QUANTAX Micro-XRF

Extended Information Depth and Trace Element Sensitivity

Both the trace element sensitivity and the information depth of XRF analysis are useful for PCB investigation. PCBs may contain hazardous elements covered by the RoHS (Reduction of Hazardous Substances) regulation. These can be detected more reliably by Micro-XRF, especially as RoHS and other regulations require low limits of detection.

Multilayer samples are especially suitable for analysis with XTrace because of their sometimes complex internal structure, which may be partly “invisible” to EDS.