Handheld XRF guns for Tin (Sn) Whisker analysis is a fast, accurate and non-destructive process that can ensure premature equipment failures do not occur in your components or materials due to tin whiskers. Verify in seconds that the necessary 3% Pb is contained in the materials to prevent the growth of tin whiskers. Components comprised of pure tin (Sn) can spontaneously grow crystalline-like barbs that can short circuit electrical components and terminals rendering your Hi-Rel (High Reliability) products unreliable. Send a message to our team members to discuss how Bruker’s Handheld XRF guns can help you prevent tin whiskers in your Hi-Rel products!
Bruker’s S1 TITAN handheld XRF gun can help you mitigate the growth of tin whiskers prior to installation as well as after installation in many components and materials including but not limited to the following: