• Dimension FastScan Atomic Force Microscope - Brochure 3.3 MB
The Dimension FastScan™ atomic force microscope delivers extreme imaging speed without sacrificing legendary Dimension Icon® resolution and performance. This breakthrough innovation enables radically faster time to publishable data for all levels of AFM expertise.
• PeakForce Tapping - Brochure 2.7MB
Bruker’s exclusive PeakForce Tapping is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode. It provides unprecedented high resolution imaging, extends AFM measurements into a range of samples not previously accessed and uniquely enables simultaneous nanoscale property mapping.
• PeakForce SECM - Brochure 2.2MB
Bruker’s exclusive PeakForce SECM™ mode is the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy (SECM) with a spatial resolution less than 100 nanometers.
• Dimension Icon SSRM - Datasheet 1.0MB
Bruker’s Dimension Icon SSRM-HR AFM configuration extends the spatial resolution and repeatability of scanning spreading resistance microscopy (SSRM) carrier profiling to address the stringent needs of current and future ITRS technology nodes.
• AutoMet AFM Software - Datasheet 1.6MB
Bruker’s AutoMET™ software brings high-volume, precise AFM measurements to demanding production environments. Available for Dimension FastScan and Dimension Icon systems, AutoMET uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology.