• Dimension Icon Atomic Force Microscope - Datasheet 1.0MB
The Dimension Icon-IRIS provides the capability to integrate the complimentary techniques of atomic force microscopy and Raman microscopy, providing critical information on both the topography and the chemical composition of a sample.

• AFM-Raman - Brochure 2.7MB
Bruker has combined the most advanced AFM and Raman techniques into powerful, seamlessly integrated research solutions.

• Worldwide Service and Support - Brochure 2.7MB
Our highly trained team of support engineers, application scientists, and subject-matter experts are wholly dedicated to maximizing your productivity with system service and upgrades, as well as application support and training across a very wide range of disciplines.

• Advances in Combined Atomic Force and Raman - AN136 5.1MB
This application note looks both at the complementary information gained from combining AFM and Raman spectroscopy and how a researcher having access to a combined system can benefit from the additional information available.

• AFM and Raman TERS - Correlated Imaging and Tip Enhanced Raman Scattering 2.8MB
Co-localized AFM and Raman instrumentation allows researchers to interrogate samples using both scanning probe techniques and optical spectroscopy, yielding detailed information about nanoscale properties and composition. Diffraction-limited AFM-Raman experiments are straightforward as is the interpretation of data. TERS provides chemical information on the nanometer scale. TERS experiments are straightforward to execute but may require special consideration of the tip-sample interaction in the optical near-field for data interpretation.