• Dimension Icon AFM-Raman - Datasheet 1.0MB
The Dimension Icon-IRIS provides the capability to integrate the complimentary techniques of atomic force microscopy and Raman microscopy, providing critical information on both the topography and the chemical composition of a sample.
• AFM-Raman Solutions - Brochure 2.7MB
Bruker has combined the most advanced AFM and Raman techniques into powerful, seamlessly integrated research solutions.
• Worldwide Service and Support - Brochure 2.7MB
Our highly trained team of support engineers, application scientists, and subject-matter experts are wholly dedicated to maximizing your productivity with system service and upgrades, as well as application support and training across a very wide range of disciplines.