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Dimension XR – Highest Performance and First-and-Only AFM Capabilities

Bruker’s Dimension XR scanning probe microscope (SPM) systems incorporate decades of research and technological innovation. With routine atomic defect resolution, and a host of unique technologies including PeakForce Tapping, Data Cube modes, SECM and nanoDMA, they deliver the utmost performance and capability. The Dimension XR family of SPMs package these technologies into turnkey solutions to address nanomechanical, nanoelectrical, and electrochemical applications. Quantification of materials and active nanoscale systems in air, fluid, electrical, or chemically reactive environments has never been easier.

 


Routine Highest Resolution in Air and Liquid

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Atomic defect in a Calcite lattice imaged in liquid using PeakForce QNM (PFQNM).

From point defects in liquid, in a stiffness map, to atomic resolution in air, in a conductivity map, Dimension XR delivers highest resolution in all measurements.

At its core Dimension XR uses Bruker’s proprietary PeakForce Tapping technology to achieve both, hard and soft matter performance benchmarks, including crystal defect resolution, molecular defects in polymers, and the minor groove of the DNA double helix structure. The same technology plays an equally important role in resolving the smallest asperities on roughened glass over hundreds of images.

Dimension XR combines PeakForce Tapping with extreme stability, unique probes technology, and Bruker’s decades of experience in developing tip scanning systems. The result is highest resolution imaging consistently, completely independent of sample size, weight, or medium – and for any application.

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Quantitative Analysis for Nanomechanical Applications

The Dimension XR Nanomechanics configuration for Icon and FastScan AFM systems provides the complete set of capabilities necessary to rapidly and quantitatively characterize materials for their nanomechanical characteristics, on samples ranging from soft sticky hydrogels and composites to stiff metals and ceramics.

The XR Nanomechanics bundled solution encompasses the full evolution of nanoscale AFM nanomechanical measurement techniques, including Bruker’s new, revolutionary AFM nano-dynamic measurement analysis. This is the first and only AFM solution that ties to bulk DMA.

Revolutionary AFM-nDMA

For the first time an AFM can provide complete and quantitative viscoelastic analysis of polymers at the nanoscale, probing materials at rheologically relevant frequencies, in the linear regime. Proprietary dual-channel detection, phase-drift correction, and reference frequency tracking enable a small strain measurement in the rheologically relevant 0.1 Hz to 20 kHz range for nanoscale measurements of storage modulus, loss modulus, and loss tangent that tie directly to bulk DMA.

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Multi-Dimensional Nanoelectrical Characterization

 

The Dimension XR Nanoelectrical configuration for Icon and FastScan AFM systems includes the most complete array of electrical AFM techniques on a single system. PeakForce TUNA™ and PeakForce KPFM™ have already built an impressive publication record of expanding materials research from conventional contact-based electrical modes to correlative electrical and mechanical data.

Now, Bruker’s new DataCube modes provide multidimensional nanoscale information at every pixel, simultaneously capturing in a single measurement both electrical and mechanical characteristics.

Proprietary DataCube Modes

These modes utilize FASTForce Volume to perform a force-distance spectrum in every pixel, with a user-defined dwell time. Using high data capture rates, a multitude of electrical measurements are performed during the dwell time, resulting in electrical and mechanical spectra at every pixel. DataCube modes provide full characterization in a single experiment, which is unheard of in a commercial AFM.

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A DCUBE-PFM measurement clearly shows the domains flipping at different potential levels for each discrete pixel on a BiFeO3 thin film.


Highest Resolution Scanning Electrochemical Imaging

The Dimension XR NanoEC configuration for Icon and FastScan AFM systems provides a turnkey solution for real-time quantitative analysis of electrochemical reactions. These systems utilize EC-AFM and PeakForce SECM™ modes to perform in-situ topography scans in the electrochemical cell, and are specifically designed for long-term in situ electrode studies under electrochemical control and in volatile solvents.

Exclusive PeakForce SECM

With a spatial resolution less than 100 nanometers, this mode redefines what is possible in the nanoscale visualization of electrical and chemical processes in liquid. PeakForce SECM dramatically improves, by orders of magnitude, the resolving power over traditional approaches. This enables entirely new research into energy storage systems, corrosion science and biosensors, opening the door to novel measurements on individual nanoparticles, nanophases, and nanopores. Only, PeakForce SECM provides simultaneous capture of topographic, electrochemical, electrical, and mechanical maps with nanometer-scale lateral resolution.

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Unlimited Flexibility to Expand Your Research

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Any Dimension XR configuration you chose for your research enables the addition of many other ala carte capabilities to further tailor your system for your exact application needs, now and in the future. Combined with our many proprietary AFM techniques, modes, and mode enhancements, the Dimension XR systems provide the unique capabilities that can take your nanoscale research to the next level.

 

Contact us to learn more.