D8 ADVANCE, X-ray diffraction


The D8 ADVANCE Twin is a versatile, ease-of-use champion offering best in class performance on polycrystalline powder and layered samples under ambient and non-ambient conditions.

Thanks to TWIN optics, switching between different instrument geometries is done with the push of a button, reliably without user intervention.

  • Bragg-Brentano geometry for unparalleled powder diffraction
  • Grazing incidence geometry for optimum polycrystalline thin film diffraction
  • XRR to determine film thickness from 0.1 nm up to 150 nm
  • Micro-diffraction with LYNXEYE XE-T detector to speed up data collection with unrivalled energy resolution
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