June 12, 2016

The New D8 ADVANCE – a plus for your research

The new D8 ADVANCE

The new D8 ADVANCE

On the occasion of this year’s European Powder Diffraction Conference (EPDIC-14) in Bari, Italy, Bruker AXS proudly presents the newest version of the D8 ADVANCE X-ray diffractometer. Thanks to the consistent implementation of our DAVINCI Design, new cutting edge technology has never been so easy to use.

The newly released TRIO optic uniquely enables completely automated switching between the three most commonly used primary beam geometries: divergent beam for conventional powder diffraction (XRPD), high intensity parallel beam for non-ideal powders, thin films, and micro-diffraction, and pure Cu-Kα1 parallel beam for high-resolution diffraction (HRXRD) of epitaxial thin films. As is the case for our established TWIN optic, switching between these geometries is done with push-button software control without any need for post-switching alignment. This saves time, increases accuracy, and lets the user concentrate on results instead of bothering with instrumentation.

The new D8 ADVANCE offers extended XRD2 functionality. The fully-integrated PILATUS3 100K-A 2D detector from DECTRIS enables high-speed, enhanced micro-diffraction analysis. Noise-free data acquisition and large angular coverage in Gamma and 2Theta facilitate detecting extremely weak diffraction signals that often result from investigations on micrometer-size areas.

The extension of the analytical capabilities is complemented by smart solutions for sample mounting with the new compact UMC stage or the Compact Cradleplus, which offers motorized z-translation, versatile sample mounting accessories, and automated height adjustment with the double-laser sample positioning system.

The new D8 ADVANCE – easy switching between all XRD applications.

 

Media Contact:
Dr. Geert Vanhoyland
Global Product Manager Materials Research
Tel: +49 721 50997 - 5080
Email: Geert.Vanhoyland@bruker.com