Surface Material Properties

How Bruker delivers rapid high-resolution quantitative mapping of surface material properties for improved material development

Nano scale material property mapping has some important benefits for the development of new materials. Adhesion or modulus maps enable the identification of components in composites and the analysis of the interfaces between them. As components become ever smaller, interface properties become increasingly important to the macroscopic material properties. In the development of thin films, mapping can provide information about uniformity and other properties.

Bruker’s atomic force microscopes (AFMs) offer advanced means to measure surface material properties. The range of options include fast, high-resolutions and quantitative maps of elastic modulus, adhesion, dissipation, and deformation, as well as time-dependent measurements and the characterization of hardness and elasticity. Advanced software allows easy analysis, visualization of data, and report generation that maximizes customers’ productivity.