On-Demand Session: Characterization of Polymeric Materials and Products
Explore the possibilities for polymer research and testing using Bruker’s AFM, nanoIR, and nanomechanical testing systems.
Watch Individual Sessions:
Characterization of Topography, Mechanical, and Electrical Behavior of Polymers at the Nanoscale
PRESENTATION HIGHLIGHTS:
- [00:00:00] AFM Imaging Technology Overview
- [00:01:05] The different AFM-compatible modes
- [00:02:19] AFM-compatible Environments Control and Probes
- [00:03:50] Applications of AFM in Polymer Research
- [00:06:16] Example of AFM Imaging on Polymers
- [00:07:10] Thermal AFM for Polymers
- [00:10:00] AFM Mechanical Mapping Measurement for Polymer Research
- [00:16:53] Investigating Viscoelasticity at the nanoscale using AFM-nDMA
- [00:18:50] Electrical Measurements for Polymer Research
Live Demo: Mechanical Measurement (AFM)
Photothermal AFM-IR with the NanoIR3 and the Icon-IR
PRESENTATION HIGHLIGHTS:
- [00:01:42] Introduction to nanoscale IR and its benefits.
- [00:02:56] Presentation of the Photothermal AFM-IR spectroscopy and Imaging Technique
[00:05:32] Key Benefits of nanoscale IR for applications on polymeric materials
- [00:05:51] Correlation with FTIR
- [00:06:55] Sub-10nm lateral chemical resolution
- [00:08:05] Sub-10nm material thickness sensitivity
- [00:09:00] Possibility to tune the information depth
- [00:11:40] High throughput chemical mapping
- [00:12:58] Correlative nanoscale imaging with PeakForce & AFM-IR
Live Demo: NanoIR3- Measurement of a Polymer Blend
Explore Viscoelastic Properties at Various Temperatures Using nanoDMA III Technology
PRESENTATION HIGHLIGHTS:
- [00:00:00] Introduction to Probing Mechanical Properties
- [00:02:00] Introduction to nanoindentation technology
- [00:05:26] Analyzing stiffness throughout the indentation test using nanoDMA III
- [00:09:54] Temperature Dependent Testing Experiment setup
Live Demo: Nanoindentation
Question & Answer
PRESENTATION HIGHLIGHTS:
- [00:00:00] During a nanoindentation experiment on metallic materials, what is a good sample preparation process if my sample is very thin (below 1 mm)?
- [00:01:23] What are the similarities and differences between PeakForce Q&M and the QI mode (also called Force Volume Mode)?
- [00:03:09] For the Q&M technique, is it necessary to calibrate with a sample of known modulus? Or is the Tip calibration sufficient?
- [00:06:37] How long would it take to generate an AFM-IR image of a couple of microns in size? And how does that compare to FT-IR?
- [00:07:38] Is there a possibility to do some of the AFM measurements in liquids
