Excellent Performance in all EBSD Applications

e-Flash series - technologically leading EBSD detector architecture

  • e-FlashFS for high speed measurements with up to 945 patterns/s (8x8 binning), improved accuracy at 630 patterns/s using 4x4 binning
  • e-FlashHD high resolution detector featuring 1600x1200 pixels native resolution; maximum speed of 170 patterns/s at 20x20 binning
  • In-situ vertical screen positioning for best available EBSD signal
  • High-accuracy guiding system with phosphor screen positioning accuracy <10 µm
  • Screen and FSE/BSE detectors replaceable by the user
  • Unique automatic detector retraction feature after measurement completion

Unique ARGUS™ FSE/BSE imaging system

Sophisticated detector design, featuring:

  • Average atomic number contrast images of highly tilted samples
  • Color-coded orientation contrast images using three independent detectors
  • Fully integrated electronics for high signal-to-noise ratio

Superior support for TKD

QUANTAX EBSD provides perfect support for Transsmision Kikuchi Diffraction:

  • TKD toolkit featuring the special TKD sample holder
  • OPTIMUS™ TKD detetor head for analysis under optimal geometrical conditions

Assistants and automated configuration for ease of use

  • Signal assistant for automatic camera setup
  • Automatic detector calibration for precise measurements
  • Point inspector for checking data quality at any location in a map

Highest speed and reliability in acquisition and evaluation

  • Real-time data processing and indexing quality control provided by pattern streaming
  • Robust indexing along grain or phase boundaries
  • Exclusion of unwanted sample parts from measurement through map area definition

Unique combined EBSD and EDS data acquisition and evaluation option

Optimal Position of EBSD and EDS Detectors for Combined Measurement
EBSD and EDS detectors in
optimum position for simultaneous
  • Advanced integration with the QUANTAX EDS system
  • Both detectors can be brought into optimum measurement position simultaneously and under vacuum
  • Simultaneous fast EBSD pattern and complete EDS spectra acquisition and evaluation possible at speeds of up to 945 patterns/s
  • Complete data re-analysis at any time

Unequaled software usability, flexibility and speed

  • Storage of band positions and solutions; pattern storage possible
  • Offline phase ID and subsequent data re-analysis at ultrafast speeds of up to 40,000 points/s
  • Fast access to all measurement and postprocessing information through easy switching between the two workspaces
  • Large number of different result presentation options including point data, maps, histograms, and texture representation tools

Instant access to all data for every measured point

  • Point inspector displays all available EBSD and EDS experimental data as well as corresponding simulated pattern

Advanced Phase-ID – excellent solution for multi-phase and mineralogical samples

Modern computer and software technology, featuring:

  • A search for candidate phases in phase databases using chemistry / elements
  • Use of all candidate phase files for ultrafast indexing of the pattern currently selected (or detected bands when used offline)
  • Instant classification of candidate phases based on their corresponding quality of fit (simulation vs. pattern)
  • For both online and offline use