D8 DISCOVER Plus, X-ray diffraction


The D8 DISCOVER Plus is the flagship of X-ray diffraction solutions. It combines the unrivalled accuracy of the ATLAS goniometer with the broadest choice of top-performance X-ray sources while staying fully compatible with a wide variety of components, optics and detectors including the benchmark setting Non-Coplanar Arm.
D8 DISCOVER Plus - Uncompromised flexibility and performance.

Please read more about the D8 DISCOVER Plus in the press release.

  • High-accuracy Non-Coplanar Arm for In-Plane Diffraction measurements with exceptional accuracy.
  • ATLASTM goniometer with industry leading guaranteed angular accuracy
  • 6 kW high efficiency Turbo X-ray Source (TXS-HE) ideal for line and spot focus application.
  • IµS microfocus x-ray source with new MONTELPlus optic for mm sized samples.
  • Full compatibility with available components, optics and detectors.

Multi-purpose Solutions

Ultimate performance in Thin-Film Analysis

Ultimate performance in Thin-Film Analysis: Equipped with IµS microfocus source and Non-Coplanar Arm the D8 DISCOVER Plus enables In-Plane GID measurements with highest accuracy - best data quality guaranteed.

Ultimate flexibility in Materials Analysis

Ultimate flexibility in Materials Analysis: Equipped with user exchangeable TWIST-TUBE source and Non-Coplanar Arm the D8 DISCOVER Plus offers a high degree of experimental flexibility without compromising performance.

D8 DISCOVER - High power materials research XRD solution

D8 DISCOVER Plus with TXS-HE: The perfect high power materials research XRD solution for all types of samples ranging from powders to polycrystalline or epitaxial films.

D8 DISCOVER Plus for high-accuracy µXRD²

D8 DISCOVER Plus for high-accuracy µXRD²: Combining ATLAS, IµS microfocus source with the flexibility of the EIGER2 detector results in a XRD solution of ultimate performance.

Dedicated Solutions

D8 DISCOVER Plus for Structure Analysis

D8 DISCOVER Plus for Structure Analysis

Extract structural information by applying X-Ray Powder Diffraction (XRPD) including Rietveld (TOPAS) analysis, diffuse or "total" scattering (PDF analysis), and Small Angle X-Ray Scattering (SAXS).

D8 DISCOVER Plus for Thin Film Analysis

D8 DISCOVER Plus for Thin Film Analysis

An additional optic bench position allows further optimization of the incident beam to balance intensity and resolution - Adapt your system to the sample requirements to obtain optimal data.

D8 DISCOVER Plus for Maximum Beam Conditioning

D8 DISCOVER Plus for maximum beam conditioning

A third primary optical bench further extends the ability to condition the beam with a variety of optics including Bartels geometry 4-bounce monochromators.