D8 DISCOVER Plus, X-ray diffraction


The D8 DISCOVER Plus is the flagship of X-ray diffraction solutions. It combines the high intensity of the TXS-HE with the unrivaled accuracy of the ATLAS goniometer while staying fully compatible with a wide variety of components, optics and detectors. D8 DISCOVER Plus - Uncompromised flexibility and performance.

Please read more about the D8 DISCOVER Plus in the press release.

  • 6kW high efficiency Turbo X-ray Source (TXS-HE) ideal for line and spot focus application
  • ATLASTM goniometer with industry leading guaranteed angular accuracy
  • Three prefigured source-to-sample distances to ensure full compatibility with available components, optics and detectors

Multi-purpose Solutions


Ultimate performance for powder XRD with push-button switching between para-focusing Bragg-Brentano for classic methods and parallel beam for capillary measurements and GID.

D8 DISCOVER - High power materials research XRD solution

The perfect high power materials research XRD solution for all types of samples ranging from powders to polycrystalline or epitaxial films.

Dedicated Solutions

D8 DISCOVER Plus for Structure Analysis

D8 DISCOVER Plus for Structure Analysis

Extract structural information by applying X-Ray Powder Diffraction (XRPD) including Rietveld (TOPAS) analysis, diffuse or "total" scattering (PDF analysis), and Small Angle X-Ray Scattering (SAXS).

D8 DISCOVER Plus for Thin Film Analysis

D8 DISCOVER Plus for Thin Film Analysis

An additional optic bench position allows further optimization of the incident beam to balance intensity and resolution - Adapt your system to the sample requirements to obtain optimal data.

D8 DISCOVER Plus for Maximum Beam Conditioning

D8 DISCOVER Plus for maximum beam conditioning

A third primary optical bench further extends the ability to condition the beam with a variety of optics including Bartels geometry 4-bounce monochromators.