INVENIO R

INVENIO R perfectly fits the needs for R&D applications where high sensitivity, spectral or temporal resolution, stability, flexibility and upgradability are required. The available broad spectral range, various validation options, integrated touch panel, TransitTM MIR transmission channel, up to 7 software selectable internal detectors, easy exchange of optical components and many further unique features make the daily work in analytical and industrial research fields easy and reliable.

Research & Development

  • Continuous, Rapid Scan and Step Scan technology for time resolved as well as amplitude modulation (AM) spectroscopy (Step Scan/Rapid Scan/Interleaved TRS)
  • FTIR spectroelectrochemistry for the in-situ investigation of electrode surfaces and electrolytes
  • Low temperature experiments, e.g. in solid state physics 
  • Investigation of proteins in water (CONFOCHECK)
  • Determination of the absolute configuration of chiral molecules (VCD)

Pharma

  • Comprehensive system validation providing data integrity with modern database fully compliant with FDA regulations for pharmaceutical laboratories
  • Characterization of stability and volatile content of medical drug products by thermal analysis(TGA-FTIR)
  • Differentiation of polymorphs of active pharmaceutical ingredients in the far infrared region (Bruker FM)

Polymers and Chemistry

  • Identification of inorganic fillers in polymer composites in the far IR region (Bruker FM)
  • Determination of volatile compounds and characterization of decomposition processes by thermal analysis (TGA-FTIR)
  • Reaction monitoring and reaction control (MIR fiber probes)
  • Identification of inorganic minerals and pigments
  • Dynamic and rheo-optical studies of polymers

Surface Analysis

  • Detection and characterization of (ultra-)thin and monomolecular layers
  • Surface analysis combined with polarization modulation (PM-IRRAS)

Material Science

  • Characterization of optical and highly reflective materials (windows, mirrors)
  • Investigation of ground samples with rough surfaces (DRIFT)
  • Characterization of the emittance behavior of materials

    Semiconductors

    • Determination of oxygen and carbon contents in silicon wafers for quality control
    • Photoluminescence measurements in near IR spectral range