Well-Balanced Design

TENSOR II is designed to optimally combine high light-throughput and a large sample compartment with compactness. The optical bench is precisely arranged and safeguarded by the tightly sealed premium-class housing from high quality structural foam which provides excellent rigidness.

External Accessories and Sampling Options

Sampling capabilities of the TENSOR II can be expanded by adding an optional external beam port. This allows the attachment of one or more external accessories.

  • HYPERION Series FT-IR microscope
  • HYPERION 3000 FT-IR imaging system
  • HTS-XT High Throughput Screening eXTension
  • IMAC Focal Plane Array Macro Imaging Accessory
  • TGA module
  • PMA 50 for VCD and PM-IRRAS
  • External sample compartment; evacuable or purgeable
  • External vacuum tight UHV-chamber adaptation
  • Integrating sphere
  • Liquid auto samplers

Advanced Electronics

Bruker's DigiTectTM detector technology ensures lowest electronic noise. It is based on modern dual-channel deltasigma ADC's with true 24-bit dynamic range integrated into the detector preamplifier electronics.
The TENSOR II offers a unique Power-Mode to improve the signal-to-noise in measurements at low light throughput with the standard DTGS detector.


TENSOR II optionally can be equipped with broadband beamsplitters to expand the spectral range either to the Near or Far Infrared. According to the range of interest source and detector can easily be exchanged by the operator. Due to electronic coding parameter settings are adapted automatically.

Technologies used are protected by one or more of the following patents:
US 7034944; US 5923422; DE 19940981