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Dimension Icon

AFM Performance and Functionality Redefined

Enabling highest performance, large sample AFM imaging over a broad range of applications

  • Delivering highest performance on any AFM sample
  • Offering broadest range of AFM modes and applications
  • Providing quantitative nanoscale material property mapping
  • Powered by PeakForce Tapping

The Dimension Icon® Atomic Force Microscope brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. The culmination of decades of large-sample AFM technology, the system has been designed from top to bottom to deliver revolutionary lowest drift and lowest noise that allows users to achieve artifact-free images in minutes instead of hours. 

The Icon AFM is powered by our proprietary PeakForce Tapping technology. This revolutionary mode in conjunction with the highest performance platform enables researchers to routinely perform nanoscale imaging and simultaneously capture nanomechanical material information. The Icon AFM superior technology is for all user levels. ScanAsyst® automatic image optimization enables the simplest approach to perform surface characterization on any sample size, multipole samples or types.  

The Icon’s proven ultimate performance, ease of use and superior versatility make it the ideal choice for practically every AFM application.

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