Contour Elite I Banner Av1

Automated, Full-Featured Surface Characterization and Imaging in a Benchtop System

The fully automated Contour Elite™ I features robust, proven and gauge-capable metrology (sub-nanometer to >10 millimeters) with unmatched Z-axis resolution and accuracy, and adds high-fidelity color and grayscale imaging. 

Contour Elite I includes a vibration-resistant base enhanced by integrated air isolation for stability and includes Bruker’s proprietary vibration-resistant measurement technology for accurate, repeatable results. It also features automatic tip-tilt in the head, a 6-inch stage, stage encoding, a fully automated turret with programmable X, Y, Z movement, and the capability for precise stitching to seamlessly synthesize thousands of individual datasets into one image.

Key Features:

  • Quantitative, repeatable surface data acquisition
  • Rapid, non-destructive imaging with real-time, automated measurement optimization
  • Industry’s best available combined lateral and vertical resolution in a 3D optical microscope
  • High-fidelity color and grayscale imaging
  • Fully automated, benchtop design with integrated air isolation
  • Patented dual-LED light source plus stage lighting
  • Automated 6-inch XY sample stage with flexible fixturing
  • User-friendly interface with access to extensive library of filters and customizable analysis options
Contour GT-I Tip-Tilt
Traditional pitch-and-roll stage designs require operator adjustment of five axes of motion to maintain point of inspection on line of sight for measurement. The unique Bruker tip/tilt in the head design maintains the line of sight on the point of inspect
Related Information