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Uncompromised Metrology, High-Fidelity Imaging, Unprecedented Value

The Contour Elite™ K 3D optical microscope provides robust and gauge-capable metrology (sub-nanometer to >10 millimeters), enhanced by high-fidelity color or monochrome imaging.

 

With unmatched Z-axis resolution and accuracy, sub-nanometer vertical resolution, and scale-independent results, it’s an ideal solution for quality control and process monitoring across diverse industries.

 

The system features manual tip-tilt in the stage, and is available with manual or optional motorized six-inch stage, as well as a fully automated turret with programmable X, Y, Z movement. Contour Elite K also provides the capability for precise stitching to synthesize thousands of individual datasets into one image.

Key Features:

  • Quantitative, repeatable, gauge-capable surface data
  • Rapid, non-destructive imaging
  • Industry’s best available combined lateral and vertical resolution in a 3D optical microscope
  • High-fidelity color and monochrome imaging
  • High-stability, bench-top vibration-tolerant design
  • Patented dual-LED light source plus stage lighting
  • Manual or motorized 6-inch XY sample stage with flexible fixturing
  • Manual or automated stitching
  • User-friendly interface and application-specific software
  • Extensive library of filters and customizable analysis options
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