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The Contour Elite™ X is designed specifically for rapid, automated investigation of widely varying sample surfaces. With the ability to capture nano- to macroscale surface features, Contour Elite X is adept at imaging deep trenches, high-aspect ratio holes, as well as samples with high or low topographic relief or even curvature.

The Elite X’s production-floor proven hardware platform, powerful Vision64® software, high-fidelity imaging capabilities, and gauge-capable measurements make it the metrology tool of choice for a wide range of industries. Offering many customization options for specific applications, Contour Elite X is well-suited for R&D metrology as well as for the rigorous measurement requirements of high-throughput, production environments.

3D Optical Microscopy Industries

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Precision Machining and Tooling

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Semiconductor and Microelectronics

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Medical Devices and Implants

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Automotive and Aerospace

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