As semiconductor devices continue to shrink in size, demands on metrology systems for higher performance and increased measurement capabilities are growing. High-quality, low-cost production depends on high-performing metrology systems for QA/QC and for process improvements. This is especially true in companies that produce precision-engineered products such as MEMS, RF filters, microfluidics devices, advanced wafer-level packaging (WLP) for chips, and high-density interconnect (HDI) printed circuit boards (PCB).
The Contour series 3D optical microscopes are based on Bruker's proprietary white light interferometry (WLI) technology, which is known for its unparalleled metrology performance. Contour systems provide precision, repeatability, and measurement reproducibility, as well as high system throughput. They are the ideal solution for the applications and environments typical in the semiconductor industry that are challenging for other metrology systems.
