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XFlash® 6T-100 oval

The High Collection Angle EDS System for STEM

XFlash 6T-100 oval

This large area - high collection angle windowless EDS detector with an oval-shaped 100 mm2 SDD is carefully customized for each suitable pole piece geometry. The unique shape and state-of-the-art slim-line design allow to optimize the acquisition geometry for very specific retrofit conditions as well.

The solid angle for X-ray collection was demonstrated to reach up to 0.7 sr in STEM at over 13° take-off angle providing atom column element mapping and individual heteroatom identification [1,2].

[1] Direct atomic scale determination of magnetic ion partition in a room temperature multiferroic material L. Keeney et al., Scientific Reports 7, Article number: 1737 (2017), open access

[2] Individual heteroatom identification with X-ray spectroscopy R. M. Stroud et al., APL 108, 163101 (2016), open access

In summary, the XFlash 6T-100 oval offers the following advantages:

  • 100 mm2 area, windowless
  • Solid collection angle up to 0.7 sr, adaptions vary
  • Take-off angle up to 13.4°, adaptions vary
  • UHV compatible
  • X-ray-tight shutter
  • Non-interfering cooling system
  • Excellent low energy performance, needed to analyze light elements and overlapping L-, M-, … lines of higher Z elements in the low energy region
  • All advantages of Bruker’s versatile analysis software

Suggested areas of application for the XFlash® 6T-100 oval are:

  • High-end element analysis by EDS in TEM and STEM, including aberration corrected electron microscopy aiming at:

    • atomic resolution
    • fast data acquisition
    • trace element analysis

More information

Watch our webinar New! Windowless high collection angle EDS detector with 100 mm2 oval silicon drift detector area

Read more about the application example Large collection angle EDS detectors for high-end STEM in materials research