Automation, X-ray diffraction

Elemental and phase analysis

Elemental analysis by X-ray fluorescence and phase analysis by X-ray diffraction is the basis of quality and process control in many industries like minerals, mining, cement and aluminium production.

The degree of automation varies between full scope, completely automated sampling, sample preparation and laboratory analysis, and partial automation on the laboratory level. Bruker AXS instruments like the “Plug ‘n Analyze” S8 TIGER Series 2 are designed for seamless integration into total automated environments.

Sample transportation to the analysers is realized either by conveyor belt or by robot. State-of-the-art sample handling allows defining different priority levels for analytical jobs. At any time jobs beside the automated tasks can be started locally. All loader positions of our instruments can be easily integrated in the sample handling of the automation concept, enabling straightforward and elegant sample management and intermediate storage.

AXSLAB - Easy, intuitive control of laboratory automations

For the control of complete or partial laboratory automation solutions Bruker AXS has developed the powerful automation software AXSLAB. It controls sample preparation, transportation and X-ray analysis. AXSLAB is a comprehensive flexible software package designed for non-technical operators.

It offers all benefits of the Windows environment from fast point and click operation to real multitasking. Its intuitive web based user interface is designed for the industrial environment. It is easy to use and requires minimum operator training. From any PC in the network single samples or sample batches can be started by pushing one button.

Device status and results can be checked easily. Analysis results can automatically be controlled against customized specifications, allowing limit checks. A graphical display shows the details and highlights the elements out of specification. Operators can add jobs at any time. An intelligent sample handling concept allows highest sample throughputs and the immediate measurement of high priority samples.