M1 MISTRAL, Compact Tabletop µ-XRF Spectrometer

Analytical Accuracy of the M1 MISTRAL

The X-ray fluorescence (XRF) analytical method offers a contact-free and non-destructive analysis with good accuracy. Since jewelry pieces are often small and intricate or even non-homogeneous, it is very important to analyze only a small area. This is possible due to the strong collimation of the excitation beam provided by the M1 MISTRAL.

Quantification can be performed both with standardless and with standard-based models. Standardless models have the advantage that they can be used for a wide range of sample qualities but offer limited accuracy. In case of standard-based models, the accuracy is improved, but they require a large set of standards that are valid only for a limited range of concentrations.

In standard-based analyses, the statistical error is in the range of the deviations. Which means that accuracy can be improved with longer measurement times. In standardless analyses, the statistical error is smaller than deviation. Therefore, an improvement of accuracy is not possible with longer measurement times but only with improved quantification models or more accurate fundamental parameters.

Download the full lab report XRF 433 (PDF)