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DIFFRAC.XRR Software

The choice for comprehensive X-ray reflectometry analysis

The physical properties of surfaces, ultra-thin single or multilayer coatings on a wide variety of materials are of paramount importance for their use.

X-ray reflectivity (XRR) is a unique analysis technique for the non-destructive and calibration free investigation of structural properties of thin films down to the sub-nanometer scale. These properties include layer thickness, roughness, mass density or chemical composition. Furthermore it is irrelevant whether the coating is amorphous or liquid, polycrystalline or epitaxial.

DIFFRAC.XRR is the powerful and easy-to-use software suite designed to analyze X-ray reflectometry measurements.

It features two different analysis approaches to best fit the users requirements: Direct layer thickness estimation from the XRR curves with a single mouse-click and fitting of a sample model against the measured data.

  • Quick thickness estimation via Fast Fourier Transform. „„
  • Detailed XRR analysis via sample-model based fitting using dynamical scattering theory. „„
  • Advanced automation and workflow capabilities including macro-recording and step-by-step execution. „„
  • Powerful and extensive report generator featuring template capability. „„
  • Comprehensive and extendable material and sample database.

Please download our DIFFRAC.XRR Flyer to get more information.