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PI Series SEM PicoIndenter Publications - 2014

In-situ nanomechanical studies of deformation and damage mechanisms in nanocomposites monitored using scanning electron microscopy
P.G. Allison, R.D. Moser, J.P. Schirer, R.L. Martens, J.B. Jordon, M.Q. Chandler
Materials Letters, 131 (2014): 313-316

Cryogenic in situ microcompression testing of Sn
A. Lupinacci, J. Kacher, A. Eilenberg, A.A. Shapiro, P. Hosemann, A.M. Minor
Acta Materialia, 78 (2014): 56-64

Small-scale mechanical behavior of zirconia
Erik Camposilvan, Oscar Torrents, Marc Anglada
Acta Materialia, 80 (2014): 239-249

In-situ scanning electron microscopy study of fracture events during back-end-of-line microbeam bending tests
K. Vanstreels, I. DeWolf, H. Zahedmanesh, H. Bender, M. Gonzalez, J. Lefebvre, S. Bhowmick
Applied Physics Letters, 105 (2014)

Microscale Fracture Toughness of Bismuth Doped Copper Bicrystals Using Double Edge Notched Microtensile Tests
M. J. McLean, C. A. Wade, M. Watanabe, R. P. Vinci
Experimental Mechanics, 54.4 (2014): 685-688

Evolution of plasticity, strain-rate sensitivity and the underlying deformation mechanism in Zn-22% Al during high-pressure torsion
In-Chul Choi, Yong-Jae Kim, Byungmin Ahn, Megumi Kawasaki, Terence G. Langdon, Jae-il Jang
Scripta Materialia, 75 (2014): 102-105

Evaluation for interface strength fluctuations induced by inhomogeneous grain structure of Cu line in LSI interconnects
Chuantong Chen, Nobuyuki Shishido, Shoji Kamiya, Kozo Koiwa, Hisashi Sato, Masaki Omiya, Masahiro Nishida, Takashi Suzuki, Tomoji Nakamura, Takeshi Nokuo, Toshiaki Suzuki
Microelectronic Engineering, 120 (2014): 52-58

Crystal orientation effect on local adhesion strength of the interface between a damascene copper line and the insulation layer
Nobuyuki Shishido, Yuka Oura, Hisashi Sato, Shoji Kamiya, Kozo Koiwa, Masaki Omiya, Masahiro Nishida, Takashi Suzuki, Tomoji Nakamura, Takeshi Nokuo, Toshiaki Suzuki
Microelectronic Engineering, 120 (2014): 71-76

Fracture strength analysis of single-crystalline silicon cantilevers processed by focused ion beam
Yoshimasa Takahashi, Hikaru Kondo, Hironobu Niimi, Takeshi Nokuo, Toshiaki Suzuki
Sensors and Actuators A: Physical, 206 (2014): 81-87