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PI Series SEM PicoIndenter Publications - Archive

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PI Series SEM PicoIndenter Publications - 2013

Grain-scale adhesion strength mapping of copper wiring structures in integrated circuits
Shoji Kamiya, Nobuyuki Shishido, Shinsuke Watanabe, Hisashi Sato, Kozo Koiwa, Masaki Omiya, Masahiro Nishida, Takashi Suzuki, Tomoji Nakamura, Takeshi Nokuo, Tadahiro Nagasawa
Surface and Coatings Technology, 215 (2013): 280-284

In situ nanoindentation: Probing nanoscale multifunctionality
Hussein Nili, Kourosh Kalantar-zadeh, Madhu Bhaskaran, Sharath Sriram
Progress in Materials Science, 58.1 (2013): 1-29

Direct correlations between fracture toughness and grain boundary segregation behavior in ytterbium-doped magnesium aluminate spinel
W. Cao, A. Kundu, Z. Yu, M.P. Harmer, R.P. Vinci
Scripta Materialia, 69.1 (2013): 81-84

In-situ microcompression study of nanostructured Mg alloy micropillars
M. Pozuelo, Y.W.Chang, J.-M.Yang
Materials Letters, 108 (2013): 320-323

Time-dependent nanoscale plasticity of ZnO nanorods
Yong-Jae Kim, Won Woo Lee, In-Chul Choi, Byung-Gil Yoo, Seung Min Han, Hong-Gyu Park, Won Il Park, Jae-il Jang
Acta Materialia, 61.9 (2013): 7180-7188

PI Series SEM PicoIndenter Publications - 2012

Existence of two twinning-mediated plastic deformation modes in Au nanowhiskers
Andreas Sedlmayr, Erik Bitzek, Daniel S. Gianola, Gunther Richter, Reiner Mönig, Oliver Kraft
Acta Materialia, 60.9 (2012): 3985-3993

Source-based strengthening of sub-micrometer Al fibers
Frédéric Mompiou, Marc Legros, Andreas Sedlmayr, Daniel S. Gianola, Daniel Caillard, Oliver Kraft
Acta Materialia, 60.3 (2012): 977-983

In-situ tensile testing of single-crystal molybdenum-alloy fibers with various dislocation densities in a scanning electron microscope
Kurt E. Johanns, Andreas Sedlmayr, P. Sudharshan Phani, Reiner Mönig, Oliver Kraft, Easo P. George, George M. Pharr
Journal of Materials Research, 27.3 (2012): 508-520

PI Series SEM PicoIndenter Publications - 2011

In situ nanomechanical testing in focused ion beam and scanning electron microscopes
D. S. Gianola, A. Sedlmayr, R. Mönig, C. A. Volkert, R. C. Major, E. Cyrankowski, S. A. S. Asif, O. L. Warren, O. Kraft
Review of Scientific Instruments, 82.6 (2011)

Quantitative stress/strain mapping during micropillar compression
X. Maeder, W.M. Mook, C. Niederberger, J. Michler
Philosophical Magazine, 91.7-9 (2011): 1097-1107

PI Series SEM PicoIndenter Publications - 2010

In situ electron backscatter diffraction (EBSD) during the compression of micropillars
C. Niederberger, W.M. Mook, X. Maeder,  J. Michler
Materials Science and Engineering: A, 527.16-17 (2010): 4306-4311

In-situ nanoindentation in the SEM
Julia D. Nowak, Karolina A. Rzepiejewska-Malyska, Ryan C. Major, Oden L. Warren, Johann Michler
Materials Today, 12.1 (2010): 44-45

PI Series SEM PicoIndenter Publications - 2009

Compression of freestanding gold nanostructures: from stochastic yield to predictable flow
W M Mook, C Niederberger, M Bechelany, L Philippe, J Michler
Nanotechnology, 21.5 (2009)

In situ SEM indentation experiments: Instruments, methodology, and applications
Rudy Ghisleni, Karolina Rzepiejewska-Malyska, Laetitia Philippe, Patrick Schwaller, Johann Michler
Microscopy Research and Technique, 72.3 (2009): 242-249

Micropillar compression studies on a bulk metallic glass in different structural states
A. Dubach, R. Raghavan, J.F. Löffler, J. Michler, U. Ramamurty
Scripta Materialia, 60.7 (2009): 567-570

Ultrahigh Strength Single Crystalline Nanowhiskers Grown by Physical Vapor Deposition
Gunther Richter, Karla Hillerich, Daniel S. Gianola, Reiner Mönig, Oliver Kraft, Cynthia A. Volkert
Nano Letters, 9.8 (2009): 3048-3052

In situ scanning electron microscopy indentation studies on multilayer nitride films: Methodology and deformation mechanisms
K.A. Rzepiejewska-Malyska, W.M. Mook, M. Parlinska-Wojtan, J. Hejduk, J. Michler
Journal of Materials Research, 24.3 (2009): 1208-1221

PI Series SEM PicoIndenter Publications - 2008

In situ mechanical observations during nanoindentation inside a high-resolution scanning electron microscope
K.A. Rzepiejewska-Malyska, G. Buerki, J. Michler, R.C. Major, E. Cyrankowski, S.A.S. Asif, O.L. Warren
Journal of Materials Research, 23.7 (2008): 1973-1979