The High-End, Easy-to-Use EBSD Analysis System

EBSD and EDS Detectors in Simultaneous Acquisition Position

Bruker's QUANTAX EBSD analysis system provides the analyst with an easy to use and advanced tool for EBSD measurement and evaluation. The system can also be used in conjunction with the QUANTAX EDS system creating the most advanced integrated EBSD/EDS system, supported by the ESPRIT 2 software under a single user interface.

  • In-situ vertically adjustable e-Flash EBSD detector series for maximum analytical flexibility, including the ARGUS™ forescattered/backscattered electron imaging system
  • Fast acquisition with 630 patterns/s (4x4 binning) or 945 patterns/s (8x8 binning) using the e-FlashFS detector
  • High resolution pattern acquisition with the e-FlashHD, providing pattern images of up to 1600x1200 pixels and an acquisition speed of 140 patterns/s (10x10 binning) and 170 patterns/s (20x20 binning). It supports measurements at low acceleration voltages (down to 5 kV) and low beam currents (down to 0.1 nA).
  • Signal assistant for acquisition setup
  • Calibration assistant for geometrical setup
  • Inspector for checking data quality
  • Band positions are saved
  • Band detection and indexing with up to 3,000 patterns/s
  • Fast re-indexing with up to 40,000 points/s
  • Offline re-calibration
  • Advanced phase ID
  • Offline phase ID
  • EDS-assisted phase discrimination
  • LED detector position indicator and multiple features for safe operation
  • Fully software controlled detector with all electronics integrated
  • Simultaneous EBSD and EDS acquisition at up to 945 patterns/s, supported by in-situ tilt feature to optimally position both detectors
  • Easy-to-use EBSD software with a single user interface
  • Individual settings can be stored in a personal user profile


The newly developed RAPID EBSD feature combines high quality FSE images with image segmentation algorithms and sparse EBSD/EDS date acquisition to enable the reconstruction of normal EBSD/EDS maps in the shortest time possible. This powerful ESPRIT 2 software feature is based on a method developed at Imperial College in London, UK. More info...

EBSD Explained

Transmission Kikuchi Diffraction

QUANTAX EBSD is available with unequaled support for on-axis Transmission Kikuchi Diffraction (TKD) analysis through the OPTIMUS™ TKD detector head and the TKD toolkit. The ESPRIT 2 software has a dedicated TKD calibration mode.

View the QUANTAX EBSD on-demand webinars

Setup Routine for EBSD Data Acquisition with ESPRIT 2
Combined EBSD and EDS Analysis on SEM
Advanced phase ID using combined EBSD and EDS on SEM
Transmission Kikuchi Diffraction in the Scanning Electron Microscope

More info


QUANTAX EBSD Fast facts (PDF flyer)

OPTIMUS™ TKD detector head (PDF brochure)

Do you need a Win10 upgrade?