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Brochures and Datasheets

• Dimension HPI - Brochure 2.5MB

 The Dimension® family of Atomic Force Microscopes (AFMs) have a long-standing reputation for providing the highest available speed and performance for industrial metrology applications.

Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high resolution imaging, extends AFM measurements into a range of samples not previously accessed and uniquely enables simultaneous nanoscale property mapping.

• AutoMet AFM Software - Datasheet 1.6MB

Bruker’s AutoMET™ software brings high-volume, precise AFM measurements to demanding production environments. Available for Dimension FastScan® and Dimension Icon® systems, AutoMET uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology.