D8 ADVANCE, X-ray diffraction

The D8 ADVANCE Family

The D8 ADVANCE is a real quick-change artist that can be configured to take on a single analytical task with great focus and dedicated components, or a fully featured, multi-purpose solution that is capable of dealing with very diverse analytical needs with highest competence.

Our famous DAVINCI design ensures for all those solutions easy (re)configuration and extensibility to exactly satisfy your analytical needs, now and in the future.

Multipurpose Solutions

D8 ADVANCE Eco

D8 ADVANCE Eco

Full-sized goniometer class powder XRD under ambient and non-ambient conditions.

D8 ADVANCE Twin

D8 ADVANCE Twin

Best powder XRD performance with push-button switching to amorphous and polycrystalline thin-film analysis under ambient and non-ambient conditions.

D8 ADVANCE Plus

D8 ADVANCE Plus

The perfect XRD solution for all samples including epitaxial thin films under ambient and non-ambient conditions.

Dedicated Solutions

D8 ADVANCE for XRD²

D8 ADVANCE for XRD²

State-of-the-art XRD² solutions enable data collection in both 2Theta and Gamma direction to provide additional information about the properties of crystalline samples.

D8 ADVANCE for Stress

D8 ADVANCE for Stress

Rely on expert XRD solutions for measuring stress and texture in machined parts, bulk and thin film samples.

D8 ADVANCE for Structure Analysis

D8 ADVANCE for Structure Analysis

Extract structural information by applying X-Ray Powder Diffraction (XRPD) including Rietveld (TOPAS) analysis, diffuse or "total" scattering (PDF analysis), and Small Angle X-Ray Scattering (SAXS).

Dynamic Beam Optimization

Dynamic Beam Optimization (DBO) provides best in class powder diffraction data by setting new benchmarks in terms of counting statistics and peak-to-background ratio, all without the need for manual instrument reconfiguration.

D8 ADVANCE with DBO

D8 ADVANCE with DBO

Dynamic Beam Optimization sets a new benchmark in terms of powder diffraction data quality


TRIO – Three in One

The TRIO™ optic is the key component of the D8 ADVANCE Plus, meeting the specific demands on the instrument resolution of the three most commonly used X-ray diffraction geometries in one single optic: 

D8 ADVANCE Plus with TRIO optics

D8 ADVANCE Plus with TRIO optics

DAVINCI Design – uncompromised ease-of-use

The DAVINCI design is the D8 ADVANCE’s landmark as a uniquely modular system. From the X-ray tube, through optics and sample stages all the way to the detectors, any user – even a novice – is capable of changing from one beam geometry to another or exchanging individual components with no trouble at all. Therefore, our D8 ADVANCE offers unparalleled adaptability to any conceivable application in X-ray diffraction.


Best Instrument Quality – Guaranteed!

XRD Goniometer

The high-speed energy-dispersive LYNXEYE XE-T detector uniquely combines fast data collection with unprecedented filtering of fluorescence and Kβ radiation. Its proprietary Variable Active Detector Window and the Motorized Anti-Scatter Screen (MASS) enable data collection from lowest 2Th angles without parasitic low-angle background scattering, in particular air scattering. The fully automated MASS retraction avoids beam cropping, even in combination with continuously variable slits that provide superb counting statistics over the whole angular range.

Motorized Anti-Scatter Screen

Motorized Anti-Scatter Screen

The knife edge position is automatically optimized to achieve maximum suppression of parasitic scatter while not cropping the beam at any angles 2Th.


  • Divergent beam for conventional powder diffraction (XRPD)
  • High intensity parallel beam for capillary experiments, height insensitive measurements, surface sensitive grazing incidence geometry (GID), coating thickness determination (XRR) and micro-diffraction (μXRD)
  • Pure Cu-Kα1 parallel beam for high-resolution diffraction (HRXRD) of epitaxial thin films and low symmetry powder samples

Bragg-Brentano geometry

Bragg-Brentano geometry

Bragg-Brentano geometry for unparalleled powder diffraction

HRXRD geometry

HRXRD geometry

2-bounce channel-cut monochromator offering superb resolution at high intensity on epitaxial samples


  • Push-button change of TWIN and TRIO optics with software-controlled SmartCalib
  • SNAP-LOCK switch to dedicated optics or different wavelengths
  • Real-time component recognition and status display
  • Smart solutions for sample mounting and positioning making daily work easier

  • Lifetime Alignment Guarantee through instrument performance verification with most recent NIST corundum standard SRM 1976
  • Solid and maintenance-free goniometer design ensures instrument performance throughout its lifetime
  • IQ/OQ procedures for regulated industries such as the pharmaceutical industry
  • Detector Guarantee, all detection elements fully working
  • Superb counting statistics allows for faster data collection and increased sample throughput
  • No parasitic low-angle background scattering massively improves data quality of pharma, clay, zeolite and other samples having a large unit cell
  • Best peak-to-background enhances sensitivity for minor phases
  • Full quantification of crystalline and amorphous phases with DIFFRAC.TOPAS

Superior data quality with DBO

Superior data quality with DBO

NIST SRM 8486 (Ordinary Portland Clinker) without (blue scan) and with Motorized Anti-Scatter Screen (red scan). All other measurement conditions left identical.


With full user convenience in mind, the TRIO optic features motorized switching between the three primary beam geometries and fully software-controlled instrument alignment without manual user intervention via unrivalled SmartCalibTM intelligence.

Grazing incidence geometry

Grazing incidence geometry

Grazing incidence geometry for optimum polycrystalline thin film diffraction

XRR geometry

XRR geometry

XRR to determine film thickness from 0.1 nm up to 250 nm


SNAP-LOCK change of optics

SNAP-LOCK change of optics

Push-button change of TWIN and TRIO optics

Push-button change of TWIN and TRIO optics


Instrument alignment

Application Reports (XRD)

D8 Family Application Report 30

D8 Family - Microdiffraction
Application Report XRD 30

D8 Family Application Report 29

D8 Family - SAXS Solutions
Application Report XRD 29


D8 ADVANCE Specifications

System

Exterior dimensions (height x width x depth) 1,868 x 1,300 x 1,135 mm
73.5 x 51.2 x 44.7”
Weight (without optional electronics) 770 kg
1,697 lbs
Safety Ultimate X-ray, machine and electrical safety compliance with latest EU directives
Type approval for X-ray safety by German National Metrology Institute (PTB)

Goniometer

Design Maintenance-free
Configuration Vertical, Theta/Theta or Theta/2Theta geometry
Measuring diameter Flexible setting, 500 mm and 560 mm predefined
Angle positioning Stepper motors with optical encoders
Smallest addressable increment 0.0001°
Instrument alignment Equal or better than +/- 0.01° over the whole angular range; most recent NIST SRM 1976 always included for verification

Available services include

  • Help desk support from highly-skilled troubleshooting professionals, to isolate and resolve hard- and software problems
  • Web-based remote instrument service for service diagnosis and applications support
  • Planned maintenance, according to your requirement
  • Customer on-site repair and maintenance service
  • Spare parts availability typically over night or within a few working days worldwide
  • Compliance services for installation qualification, operational qualification / performance verification
  • Site planning and relocation

Bruker Support

On our support website you will find:

  • Software Updates
    System software updates are available online to registered users.

  • Documentation
    Product manuals and installation guides are available online to registered users.
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