AFM Electrical Measurements Course

October 8-10, 2019 | Santa Barbara, CA

DAY 1 | Kelvin Probe Force Microscopy


DAY 3 | Piezo Force Microscopy

(Optional: Upon request, you may also stay on Friday to have more hands-on practice)

Course Objectives

This class is focused on material’s electrical property measurements using AFM.

Four different techniques will be discussed: Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), Tunneling Current AFM (TUNA), and Piezo Response Force Microscopy (PFM). KPFM measures material work function as well as surface charge. SCM is one of the primary techniques for doping profile mapping in semiconductor industry. TUNA can measure material’s electrical conductivity with wide range of current from fA-uA. PFM is used to study piezo material on nanoscale.


Register Here


Daily lunch is included.
Individuals are responsible for their own transportation and lodging.

* Two free seats for Premium Care service contract customers and one free seat for Standard Care service contract customers.