AFM Electrical Measurements Course

June 12-14, 2018 | Santa Barbara, CA

Tuesday - Thursday, June 12 - 14, 2018
112 Robin Hill Road, Santa Barbara, CA

DAY 1 | Kelvin Probe Force Microscopy


DAY 3 | Piezo Force Microscopy

(Optional: upon request, you may also stay on Friday to have more hands-on practice)

Course Objectives

This class is focused on material’s electrical property measurements using AFM.


Four different techniques will be discussed: Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), Tunneling Current AFM (TUNA), and Piezo Response Force Microscopy (PFM).  KPFM measures material work function as well as surface charge. SCM is one of the primary techniques for doping profile mapping in semiconductor industry. TUNA can measure material’s electrical conductivity with wide range of current from fA-uA. PFM is used to study piezo material on nanoscale.



This class includes both theory sessions and lab sessions. In the lab sessions, students can practice each technique on Bruker AFMs. Students are welcome to bring their own sample to practice.


Register Here


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Daily lunch is included.
Individuals are responsible for their own transportation and lodging.

* One free seat for platinum service contract customers. Bruker also offers a 20% discount to actively enrolled students, extended warranty customers, or second seat of platinum service contract customers.