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AFM Electrical Measurements Course

May 23-25, 2017 | Santa Barbara, CA

Tuesday - Thursday, May 23 - 25, 2017
112 Robin Hill Road, Santa Barbara, CA

DAY 1 | Kelvin Probe Force Microscopy

DAY 2 | SCM & TUNA

DAY 3 | Piezo Force Microscopy

Course Objectives

This class is focused on material’s electrical property measurements using AFM.

 

Four different techniques will be discussed: Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), Tunneling Current AFM (TUNA), and Piezo Response Force Microscopy (PFM).  KPFM measures material work function as well as surface charge. SCM is one of the primary techniques for doping profile mapping in semiconductor industry. TUNA can measure material’s electrical conductivity with wide range of current from fA-uA. PFM is used to study piezo material on nanoscale.

 

 

This class includes both theory sessions and lab sessions. In the lab sessions, students can practice each technique on Bruker AFMs. Students are welcome to bring their own sample to practice.

Register

Register Here

Agenda:

Coming Soon

Cost:

$1,500/person* 
Daily lunch is included.
Individuals are responsible for their own transportation and lodging.

* One free seat for platinum service contract customers. Bruker also offers a 20% discount to actively enrolled students, extended warranty customers, or second seat of platinum service contract customers.