AFM High-Resolution Imaging Course

April 17-19, 2018 | Santa Barbara, CA

Tuesday – Thursday, April 17-19, 2018
112 Robin Hill Road, Santa Barbara, CA

DAY 1 | Imaging Quality

DAY 2 | High-Resolution AFM Imaging

DAY 3 | Image Processing

(Optional: upon request, you may also stay on Friday to have more hands-on practice)

Course Objectives:

In this class, we will talk about image quality and high resolution AFM imaging.

Image quality session will cover in theory of contact mode, Tapping Mode, and PeakForce Tapping with ScanAsyst, along with a discussion of the advantages and disadvantages of each mode. There will also be instruction on how to optimize the scanning parameters to improve image quality. This session will discuss common imaging artifacts and how to recognize and prevent them.

In the high resolution AFM imaging session, we will discuss challenges we typically facing in high resolution imaging, and techniques of how to overcome them. We will talk about how to achieve high resolution imaging in both air and fluid.

We will close with a session discussing image processing using Nanoscope Analysis.


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Daily lunch is included.

Individuals are responsible for their own transportation and lodging.

* One free seat for platinum service contract customer. Bruker also offers a 20% discount to actively enrolled student, extended warranty customer, or second seat of platinum service contract customer.