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Polycrystalline thin film and coatings analysis - Application Training

About the training

The training will show the theoretical fundamentals and measurement techniques relevant for analysis of polycrystalline thin films and coatings. The main focus is on using the D8 ADVANCE and DISCOVER diffractometers as well as the DIFFRAC.LEPTOS software. The course will be conducted in English, therefore good knowledge of English is also required.

This course takes place in the same week as the “Epitaxial Thin Film Analysis” course.


Course Outline and Agenda

Day 1, 10am - 5pm

  • Introduction and theory of X-ray reflectometry
    • Basics of specular reflection; interference, critical angle, density, roughness and thickness
    • Basics of off-specular reflection, instrument effects
  • Practical exercises on a D8 ADVANCE/ DISCOVER
    • XRR sample alignment and reflectometry measurements


Day 2, 9am - 5pm

  • Introduction and theory of grazing incidence diffraction
  • Practical exercises on a D8 ADVANCE/ DISCOVER
    • Sample alignment and measurements for XRR and GID
  • Hands-on computer exercises using DIFFRAC.LEPTOS
    • Strategies for simulation of reflectivity curves
    • Analysis and fit of reflectometry data

Day 3, 9am - 12pm

  • Practical exercises on a D8 ADVANCE/ DISCOVER
    • Performance and optimization of GID measurements
  • Phase identification in DIFFRAC.EVA

To register, please fill out the online registration form.

More details

The participant should be familiar with the equipment and all its components and their functions. Knowledge of the basic principles of the operation of the system is a prerequisite. Training should not precede the installation of the system concerned.

Class size

Class sizes are limited, so that each participant receives individual attention and participates in all hands-on activities. Early registration is encouraged as registrations are accepted on a first-come/first-served basis.


Attendance Fee

The course price includes course materials, lunch and refreshments. Travel and accommodation are not included.



Registrations cancelled within 10 working days prior to the start of the course are subject to a cancellation fee of 30 %. Registered persons not attending the course without having given prior notice will be fully charged. We reserve the right to cancel a course if there are less than three registrants by the registration deadline.


Our Facility

Bruker AXS GmbH
Training Center
Östliche Rheinbrückenstr. 49
76187 Karlsruhe

Tel: +49 721 50997-0
Fax: +49 721 50997-5222

See all XRD trainings at Bruker AXS



Click here for information on accomodations in the Karlsruhe area.



For further information about the course content, please contact:
Dr. Fernando Rinaldi, Application Scientist XRD,


For registration or other questions, please contact: