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EDS, WDS, EBSD, Micro-XRF on SEM and Micro-CT for SEM Webinar Archive

Below you will find webinars that took place in 2010, 2011 & 2012.

2011 & 2012

Webinar Content
Oct 25, 2012

Combining Measurement Methods: The Benefit of Fast Analytical Instruments
The ultimate goal of every analyst is to get “the most” out of a sample. Bruker offers instruments for many different analytical methods and the instruments have become more powerful and increasingly faster in the past couple of years. This webinar discusses the advantages and limitations of combining 3D µ-XRF, 3D EDS, EBSD, 3D Micro-CT and LA-ICP-MS to analyze a single sample and to investigate as many aspects as possible.
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Jun 13, 2012

Introducing XFlash® 6 – The New EDS Detector Series for SEM and TEM
This webinar will discuss the benefits of the detectors' improved performance parameters in the everyday use of an energy-dispersive X-ray spectrometer. Spectrometry on SEM and S/TEM – including sensitive aberration corrected instruments – will be examined. Additionally various application examples will be presented.
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Apr 25, 2012

X-ray Expeditions into Geosciences and Mining
Our speakers will present a wealth of application examples to underline the advantages of energy-dispersive X-ray spectrometry on the scanning electron microscope (EDS) and micro X-ray fluorescence analysis (µ-XRF) in the geosciences and mining application fields.
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Webinar Content
Jan 11, 2012

Advanced phase ID using combined EBSD and EDS on SEM
Electron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometry (EDS) are common analytical methods used on the scanning electron microscope (SEM). The two complementary techniques provide structural and respectively compositional information. Continuing to build on its recent developments in integrating EBSD and EDS, Bruker is now releasing an advanced phase identification feature. This new method will significantly increase efficiency when dealing with multiphase materials and allow expert as well as less experienced users to acquire the best quality results.
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Apr 04, 2011

Combined EBSD and EDS Analysis on SEM
Electron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometry (EDS) are common analytical methods used on the scanning electron microscope (SEM). EBSD provides structural and EDS compositional information. Due to tough requirements on hard- and software for combined analysis, both are mostly used separately or provide quite low acquisition rates. Recent developments in Bruker’s technology enable simultaneous EBSD and EDS analysis with speeds of several hundreds of patterns per second. So why not obtain structural and chemical information at the same time and gain maximum information on a sample?
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2010

Webinar Content
Dec 13, 2010

Trace Element Analysis of Industrial Wastewater and Sewage with TXRF and ICP-MS
Join Mike Beauchaine and Andrew Toms as they present the capabilities of TXRF and ICP-MS for trace element analysis of wastewater. Learn about the combined advantages of the two techniques for routine, industrial and mobile lab testing.
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Oct 06, 2010

Multi-Channel Detectors for EDS on SEM
For many years Bruker has pioneered the design and production of multi-SDD systems and multi-channel SD detectors for EDS on scanning electron microscopes and microprobes. In this webinar we want to show which systems are currently available from Bruker and what their benefits are. The webinar will therefore contain a multitude of application examples.
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Sep 28, 2010

Industrial Minerals:
EDXRF for Direct Analysis without Digestion
This webinar highlights the capabilities, limitations and advances of benchtop and handheld EDXRF for use on minerals, such as limestone, feldspars, and sand.
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Webinar Content
Jun 02, 2010

Developments in quantitative EDS analysis with a focus on light element and low energy peaks
Quantitative EDS analysis has become a standard method in the characterization of samples in the electron microscope. The software shipped with modern energy dispersive spectrometry systems provides good results in automatic analysis modes with little user interaction for many routine applications. However, there may be cases where less satisfactory or even wrong results are obtained. This can have a number of different causes, most common are element peak overlaps, and – nowadays of increasing importance – the necessity to analyze the peaks of elements at low energies. The latter mainly results from the desire to improve spatial resolution of bulk sample EDS analyses by reducing the accelerating voltage of the scanning electron microscope. Thanks to the efficiency and energy resolution of state-of-the-art EDS detectors, analysis of specimens at accelerating voltages of 5 kV or lower within reasonable time has become possible.
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