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Microanalysis with High Spectral Resolution: The Power of QUANTAX WDS for SEM

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Comparison of EDS and WDS spectra of semiconductor tantalum silicide (TaSi2).
Comparison of EDS and WDS spectra of semiconductor tantalum silicide (TaSi2).
XSense – Bruker`s QUANTAX WD spectrometer with parallel beam optics.
QUANTAX WDS with XSense spectrometer for ultra-sensitive wavelength-dispersive spectrometry

High spectral resolution (high energy resolution) is one of the primary arguments for the deployment of wavelength dispersive spectrometry (WDS) in X-ray microanalysis: The limited spectral resolution of energy dispersive spectrometry (EDS) frequently leads to challenging analytical tasks due to serious peak overlaps. Such peak overlaps concern all fields of scientific and industrial X-ray microanalysis applications including biological, geological and material science samples.

Here we present typical examples from various materials where the superior spectral resolution provided by the QUANTAX WDS is evident and facilitates exact and reproducible determination and quantification of the respective elements in the samples.

The 30-minute webinar will provide an overview of the QUANTAX WDS system and will particularly focus on the capabilities of the XSense WD spectrometer, system ease-of-use and EDS – WDS method coupling.

The webinar will be round off by a 15-minute Q&A session where our experts will answer your questions.

Who should attend?

  • Quality control specialists using X-ray micro analysis in industry and material research laboratories
  • Researchers in R&D

Speakers

  • Dr. Joerg Silbermann, Product Manager WDS, Bruker Nano Analytics
  • Dr. Michael Abratis, Sr. Applications Scientist, Bruker Nano Analytics

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