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QUANTAX EBSD with OPTIMUS™ TKD - Transmission Kikuchi Diffraction Under Optimum Conditions

Free Webinar

OPTIMUS™ TKD Detector Head
The OPTIMUS™ TKD detector head with ARGUS™ direct electron imaging system
ARGUS SiC Image in Transmission
Orientation image obtained in transmission mode using ARGUS™

Transmission Kikuchi Diffraction (TKD) is an increasingly popular technique for microstructural analysis in the SEM. Compared to Electron Backscatter Diffraction (EBSD) a spatial resolution improvement of up to one order of magnitude can be achieved. Despite the fact that EBSD hardware can be used for TKD there are a number of drawbacks to be considered, e.g. regarding the use and set up of electron transparent samples and the EBSD detector, in particular as the latter is actually not designed for TKD applications.


This free one-hour webinar will explain the TKD analysis technique and outline common challenges, for instance regarding sample-detector geometry. The optimized TKD analysis solution by Bruker will be introduced which comprises the unique OPTIMUS™ TKD detector head for best sample-detector geometry, the TKD Professional Toolkit for SEM with the TKD sample holder, the integration of TKD in our ESPRIT 2 analytical software suite and the high performance and fully compatible e-Flash EBSD detector series. Different application examples of TKD will be presented and explained. After the summary a Q&A session will round off the webinar.

 

Speaker

  • Dr. Daniel Goran, Product Manager EBSD, Bruker Nano GmbH

Who should attend?

  • Researchers working in electron microscopy labs studying nanocrystalline or ultra-fine-grained materials
  • Materials and earth science lecturers and students
  • EBSD users interested in advanced applications of the method

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