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Automated Analysis of Decorative and Functional Coatings with the M1 MISTRAL Micro-XRF Spectrometer

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Automated coating analysis for quality control (here: chips for EMV cards)
Automated coating analysis for quality control (here: chips for EMV cards)
XSpect Pro software for instrument control and automated coating analysis
XSpect Pro software for instrument control and automated coating analysis

Micro-XRF spectrometry has become a well-established method for non-destructive elemental analysis of coatings. The automated multiple point analysis for the monitoring of process capability is mainly used in quality control measurements on coated systems with repeating patterns, such as edge connector contacts on PCBs, or on a multitude of intricate parts, such as jewelry chain links.

 

This webinar will discuss the measurements of coatings on electronic parts using the M1 MISTRAL Micro-XRF spectrometer. You will get to know how the new XSpect Pro software enables a straightforward, automated analysis along the sample stage for a wide range of coatings in the electronics, automotive and jewelry industry. You will see how the thickness of multilayers as well as their composition can be easily measured and statistically evaluated. You will also learn how regular point patterns can be programmed and, by use of reference points, transferred onto samples of the same structure.

 

This webinar will be round off by a 15-minute Q&A session where our experts will answer your questions.

Speakers

  • Dr. Max Buegler, Applications Specialist, Bruker Nano Analytics
  • Falk Reinhardt, Application Scientist Micro-XRF, Bruker Nano Analytics

Who should attend?

  • Quality control specialists assuring the quality of coatings in the electronics, automotive and jewelry industry
  • Coating quality control technicians responsible for quality assurance and failure analysis in industrial manufacturing processes

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