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Latest advances in identifying mineral composition variation by the M4 TORNADO AMICS:

Illustrated by the identification of compositional variation in plagioclase from a granite – Free Webinar – Register Today!

Illustration of different compositional zones identified in a plagioclase from a granite sample.
Illustration of different compositional zones identified in a plagioclase from a granite sample.
Ultra-fast high resolution elemental distribution analysis, powerful mineral identification and classification with the M4 TORNADO AMICS
The M4 TORNADO AMICS brings together the ultra-fast high resolution elemental distribution analysis of Bruker's M4 TORNADO spectrometer with the powerful mineral identification and classification software AMICS.

Bruker’s new game changing M4 TORNADOAMICS spectrometer allows the creation of mineral maps from spatially resolved X-ray Fluorescence (XRF) signals. This enables a new way to discover minerals and investigate rocks samples in the decimeter to micrometer range, including drill cores and thin sections.

Sample preparation is minimal – as long as the surface to be analyzed is reasonably flat. This makes this instrument the ideal screening tool and complement to other automated mineralogy tools and SEMs.

The addition of an extensive database of synthetically generated mineral spectra and the capability in AMICS to browse and search spectra, greatly enhance the mineral classification. In addition the capability of grouping spectra based on a variety of properties allows the user to identify variation in X-ray spectra with a sensitivity and confidence previously not possible.

During this webinar it will be demonstrated how these features were used to identify zoning in plagioclase grains in a granite sample to indicate at least four variations of feldspar composition within the labradorite and oligoclase range.

The webinar will be rounded off by a 15-minute Q&A session where our experts will answer your questions.

Speakers

  • Gerda Gloy, Application Specialist, AMICS, Bruker Nano Analytics
  • Samuel Scheller, Sr. Product Manager Micro-XRF, Bruker Nano Analytics

Who should attend?

  • Geoscientists
  • R&D representatives in mining and Oil and Gas
  • Current Micro-XRF and Automated Mineralogy users

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