Service-training-banner.jpg

Screening of restricted elements including sample thickness correction with the M1 MISTRAL Micro-XRF spectrometer

Free Webinar – Register Today!

With the M1 MISTRAL benchtop Micro-XRF spectrometer contaminations of a wide range of restricted elements can be analyzed regardless of the sample type.
With the M1 MISTRAL benchtop Micro-XRF spectrometer contaminations of a wide range of restricted elements can be analyzed regardless of the sample type.
The lead content in solder bumps, which must be zero in most industries, can be easily determined with the M1 MISTRAL.
The lead content in solder bumps, which must be zero in most industries, can be easily determined with the M1 MISTRAL.

The M1 MISTRAL combines the powerful Micro-XRF technique with an ease of operation in industrial quality control, for example, to determine contaminations and trace elements. Designed for fast and cost-efficient operation, the M1 MISTRAL provides accurate information on the elemental composition of materials through contactless, non-destructive analysis. It allows screening of restricted elements (heavy elements), which can partly replace or limit the amount of more costly analysis methods such as ICP-MS.

 

Virtually all kind of samples can be analyzed in this way, no matter the density, although certain specialties have to be taken into account and will be explained on real measurements during this webinar. The M1 MISTRAL is designed to be used with minimum considerations in advance, such as the sample thickness in case of low density samples. In addition to the benefits of Micro-XRF for the screening of restricted elements, the M1 MISTRAL uses small spot sizes for separating the sample area of interest. In combination with a stage program, the quality control workflows can be partially automated, ensuring systematic screening of the complete sample surface or multiple samples at once.

 

There will be a 15 minute Q&A session where our experts will answer your questions.

Speakers

  • Falk Reinhardt, Application Scientist Micro-XRF, Bruker Nano Analytics
  • Robert Erler, Product Manager Micro-XRF, Bruker Nano Analytics

Who should attend?

  • Quality control specialists checking incoming material and final products for restricted elements (consumer goods, health care, electronic waste)
  • Personnel of regulatory agencies updating their possibilities in the regulation process

View the Webinar

View recording
Download slides