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使研究人員能夠隨時通過PeakForce Tapping®技術得到高解析度的圖像。

Slide 1 mockup short



Dimension Icon Point Defect Resolution on Calcite v1


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Unleash Bandwidth to Go Fast

Increasing scan speed in air without loss of performance with Fast Tapping.

Achieve 4X speed gain for samples with nm roughness with adaptive scan option.

Fast Tapping on SiO wafer

Fast Tapping on SiO wafer

Fast tapping on ITO

Fast Tapping on ITO

Immediately double the imaging speed with bidirectional scan option.

Scan up to 10X faster by following the BKM with Bruker’s proprietary fast probe.

FastScan C probe

Fastscan-C Probe


使研究人員能夠隨時通過PeakForce Tapping®得到高解析度的圖像。

Nanoscale viscoelastic characterization with high confidence.

Pspmma image icon more v1

3D surface representing sample topography with false coloring by loss modulus. Blue areas have higher loss modulus and the red areas are lower loss modulus corresponding to the PS matrix and PMMA inclusions respectively. Loss modulus map generated by contact resonance via Bruker’s FASTForce Volume Nanomechanics mode. 5µm scan, ~ 590kHz, 256x256 pixels.

FastScan syndiotactic polypropylene domains v1

Syndiotactic polypropylene domains (violet) surrounded by a PMMA (teal) matrix. Topographic data painted with modulus to allow easy identification of components, revealing lamellae formed by syndiotactic polypropylene that propagate through the PMMA matrix. Image size 8 µm.








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Acquiring nanoelectrical and nanochemical data for advanced AFM research.









Capture the most s1v1

Current imaging on vertically standing carbon nanotubes. Only possible with PeakForce TUNA®.

Capture the most s2v1

Left: Atomic-scale force cube with PeakForce Capture™ showing the positions of individual atoms in a vertical (XZ) cut. Right: Averaged PeakForce Capture data showing evidence of solvent structure.








FastScan Realtime v1

PeakForce Tapping height images (left) and force curves (right) showing the difference in surface atom arrangement and atomic scale tip-sample interaction between calcite and mica.


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使研究人員能夠隨時通過PeakForce Tapping®得到高解析度的圖像。

Unlimited Potential s1v1






先使用 已有的測量模式;如果沒有,創造一個。

Unlimited Potentail S2v1
FastScan Custom collage v2

Left: AFM-Raman correlation while in glove box. Right: Photoconductive AFM accessory.







FastScan Coding v1

Left: Instrument integration example using COM access to NanoScope. Right: NanoScript programming in C++ environment.

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ScanAsyst® 圖像優化軟件,讓所有使用者能夠獲得專家級結果。

FastScan Publication Graph v2