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最高解析度成像—無論何時,不論哪次

使研究人員能夠隨時通過PeakForce Tapping®技術得到高解析度的圖像。

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在樣品上每個原子實現力掃描。




在感興趣的位置操作獲得高解析圖像。

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點缺陷的高解析三維尺寸和機械性能成像。

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Unleash Bandwidth to Go Fast

Increasing scan speed in air without loss of performance with Fast Tapping.






Achieve 4X speed gain for samples with nm roughness with adaptive scan option.

Fast Tapping on SiO wafer

Fast Tapping on SiO wafer

Fast tapping on ITO

Fast Tapping on ITO






Immediately double the imaging speed with bidirectional scan option.






Scan up to 10X faster by following the BKM with Bruker’s proprietary fast probe.

FastScan C probe

Fastscan-C Probe


獲得最完整的奈米尺度定量信息

使研究人員能夠隨時通過PeakForce Tapping®得到高解析度的圖像。






Nanoscale viscoelastic characterization with high confidence.

Pspmma image icon more v1

3D surface representing sample topography with false coloring by loss modulus. Blue areas have higher loss modulus and the red areas are lower loss modulus corresponding to the PS matrix and PMMA inclusions respectively. Loss modulus map generated by contact resonance via Bruker’s FASTForce Volume Nanomechanics mode. 5µm scan, ~ 590kHz, 256x256 pixels.

FastScan syndiotactic polypropylene domains v1

Syndiotactic polypropylene domains (violet) surrounded by a PMMA (teal) matrix. Topographic data painted with modulus to allow easy identification of components, revealing lamellae formed by syndiotactic polypropylene that propagate through the PMMA matrix. Image size 8 µm.

 

 

 

 

 

常規地獲得高品質力學性能數據。

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Acquiring nanoelectrical and nanochemical data for advanced AFM research.

 

 

 

 

 

在之前不可能研究的樣品上研究電學性能。

 

 

Capture the most s1v1

Current imaging on vertically standing carbon nanotubes. Only possible with PeakForce TUNA®.

Capture the most s2v1

Left: Atomic-scale force cube with PeakForce Capture™ showing the positions of individual atoms in a vertical (XZ) cut. Right: Averaged PeakForce Capture data showing evidence of solvent structure.

 

 

 

 

 

獲取整體力學數據,從而全面性質接觸力學機制。




即時研究原子化學信息。

FastScan Realtime v1

PeakForce Tapping height images (left) and force curves (right) showing the difference in surface atom arrangement and atomic scale tip-sample interaction between calcite and mica.

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潛力無限—靈活,開放

使研究人員能夠隨時通過PeakForce Tapping®得到高解析度的圖像。

Unlimited Potential s1v1



全面的環境控制方案,用於電池、有機太陽能等領域。

 

 

 

 

先使用 已有的測量模式;如果沒有,創造一個。

Unlimited Potentail S2v1
FastScan Custom collage v2

Left: AFM-Raman correlation while in glove box. Right: Photoconductive AFM accessory.

 

 

 

在開放的平臺上直接進行改造,與其它技術聯用。

 

直接控制軟體和硬件,選擇一個最容易的方法:串行通訊端口,信號測試盒,Nanoman/Litho和力腳本等。

FastScan Coding v1

Left: Instrument integration example using COM access to NanoScope. Right: NanoScript programming in C++ environment.

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超乎想象的簡單

ScanAsyst® 圖像優化軟件,讓所有使用者能夠獲得專家級結果。

FastScan Publication Graph v2



NanoScope®世界上最被認可的,被引用最多的原子力顯微鏡。












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