Dimension XR – Highest Performance and First-and-Only AFM Capabilities

From point defects in liquid, in a stiffness map, to atomic resolution in air, in a conductivity map, Dimension XR delivers highest resolution in all measurements.

At its core Dimension XR uses Bruker’s proprietary PeakForce Tapping technology to achieve both, hard and soft matter performance benchmarks, including crystal defect resolution, molecular defects in polymers, and the minor groove of the DNA double helix structure. The same technology plays an equally important role in resolving the smallest asperities on roughened glass over hundreds of images.

Dimension XR combines PeakForce Tapping with extreme stability, unique probes technology, and Bruker’s decades of experience in developing tip scanning systems. The result is highest resolution imaging consistently, completely independent of sample size, weight, or medium – and for any application.

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The Dimension XR Nanomechanics configuration for Icon and FastScan AFM systems provides the complete set of capabilities necessary to rapidly and quantitatively characterize materials for their nanomechanical characteristics, on samples ranging from soft sticky hydrogels and composites to stiff metals and ceramics.

The XR Nanomechanics bundled solution encompasses the full evolution of nanoscale AFM nanomechanical measurement techniques, including Bruker’s new, revolutionary AFM nano-dynamic measurement analysis. This is the first and only AFM solution that ties to bulk DMA.

Revolutionary AFM-nDMA

For the first time an AFM can provide complete and quantitative viscoelastic analysis of polymers at the nanoscale, probing materials at rheologically relevant frequencies, in the linear regime. Proprietary dual-channel detection, phase-drift correction, and reference frequency tracking enable a small strain measurement in the rheologically relevant 0.1 Hz to 20 kHz range for nanoscale measurements of storage modulus, loss modulus, and loss tangent that tie directly to bulk DMA.

The Dimension XR Nanoelectrical configuration for Icon and FastScan AFM systems includes the most complete array of electrical AFM techniques on a single system. PeakForce TUNA™ and PeakForce KPFM™ have already built an impressive publication record of expanding materials research from conventional contact-based electrical modes to correlative electrical and mechanical data.

Now, Bruker’s new DataCube modes provide multidimensional nanoscale information at every pixel, simultaneously capturing in a single measurement both electrical and mechanical characteristics.

Proprietary DataCube Modes

These modes utilize FASTForce Volume to perform a force-distance spectrum in every pixel, with a user-defined dwell time. Using high data capture rates, a multitude of electrical measurements are performed during the dwell time, resulting in electrical and mechanical spectra at every pixel. DataCube modes provide full characterization in a single experiment, which is unheard of in a commercial AFM.