EDS, WDS, EBSD, SEM Micro-XRF and SEM Micro-CT - Electron backscatter diffraction analysis, 3D computed X-ray tomography, QUANTAX for SEM, QUANTAX for TEM, Wavelength-dispersive spectrometry, QUANTAX Micro-XRF

EDS, WDS, EBSD, Micro-XRF on SEM and Micro-CT for SEM

Advancing compositional and structural analysis in electron microscopy

Bruker offers a powerful range of systems for energy-dispersive (EDS) and wavelength-dispersive (WDS) X-ray spectrometry, electron backscatter diffraction analysis (EBSD), as well as micro-X-ray fluorescence and micro computed tomography on the electron microscope.

QUANTAX EDS for SEM is the fast and versatile EDS system for scanning electron microscopy. QUANTAX EDS for S/TEM provides excellent EDS performance on the transmission or scanning transmission electron microscope without affecting instrument performance. QUANTAX WDS is Bruker’s solution for high-precision wavelength-dispersive X-ray spectrometry on the SEM. QUANTAX EBSD is the top performing and easy-to-use EBSD system for SEM. QUANTAX Micro-XRF adds the capabilities of a complete micro-XRF spectrometer to a scanning electron microscope.

Micro-CT for SEM offers new insight in internal sample structures using 3D computed X-ray tomography.