Parasitic scattering, such as air, instrument, and sample support scattering, are common contributions to X-ray powder diffraction data. The consequence is not simply an unpleasant looking powder diffraction pattern, but a significant reduction in sensitivity in terms of lower limits of detection and quantification. The distinction between instrument scattering, small angle X-ray scattering, and scattering of amorphous content can become very difficult, if not impossible.
In this 30-minute webinar we show you how to acquire powder diffraction patterns virtually free of parasitic scattering, thanks to the "Dynamic Beam Optimization" feature available for all members of Bruker's D8 diffractometer family.
Dr. Christina Drathen
Product Manager XRD, Bruker AXS
Dr. Arnt Kern
Head of Product Management XRD, Bruker AXS