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Japan - Tokyo

Atomic Force Microscopy, Ellipsometry, Fluorescence Microscopy, Mechanical Testing, Nanomechanical Test Instruments, Optical Profilometry, Reflectometry, Tribology, X-ray Fluorescence

Supporting the countries: Japan
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Postal address

Bruker Japan K.K. Nano-surface Division
1-4-1, Shinkawa
Chuo-ku,
Tokyo, 104-0033, Japan