XRM Training

XRM Training

XRM Image Analysis I

XRM User Training

September. 17. 2026

Topic: XRM Image Analysis I – Quantifying 3D Pore Structures: Porosity and Void Volume Distribution

Agenda: This session introduces how to quantify 3D pore structures from XRM data, including porosity and void volume distributions.

These parameters can be used for defect analysis and process optimization.

Date: 17. September. 2026 (Thursday)
Time: 3pm KST / 2pm SGT
Duration: 1 Hour
Language: English
Platform: Webex (Online)
Speaker: Sanae Takasugi

SKYSCAN 2214

SKYSCAN 2214 CMOS

Floor standing nano-XRM with high power source, advanced vibration isolation and multiple detectors providing highest versatility.

Image of the X4 POSEIDON - the compact benchtop design of the system is evident.

X4 POSEIDON

The X4 POSEIDON is a powerful system for micro-CT and 3D X-ray microscopy that delivers the functionality of a floor-standing system in a compact benchtop design.