▶ Watch On-Demand | 1 Hr 55 Minutes

Qualifying Surface and Device Performance Through Roughness Quantification

Learn how to measure micro-roughness in accordance with the ISO 25178 norm and improve product and process design
Presented by Samuel Lesko, Ph.D., Dir. of Technology and Apps Development, Bruker Nano Surfaces & Metrology (June 17, 2019)

       PRESENTATION HIGHLIGHTS:

  • [00:04:05] Selecting a roughness measurement method given the intended application
  • [00:07:39] When to use areal vs. profile methods
  • [00:10:37] Why to assess surface roughness via areal methods in accordance with ISO 25178
  • [00:18:09] Selecting the best-fit instrument for areal roughness measurement (why select WLI)
  • [00:29:31] How to pick the ideal filter cutoff
  • [00:31:51] Case Studies - Picking the most relevant roughness parameter(s)


       LIVE AUDIENCE Q&A:

  • [00:55:22] How to know what role a parameter plays related to surface or device efficiency?
  • [00:57:16] What parameter would you use to correlate adhesion with efficiency/performance?
  • [00:58:50] How to compare before- and after-service measures for volumentric parameters?
  • [01:02:02] What is the value of v parameters for quantifying asperities on a surface?
  • [01:03:07] What is true lateral resolution when the objective is set to 0.5x optical resolution?
  • [01:03:51] Can focus variation correlate roughness and functionality?
  • [01:04:40] When is scanning WLI best for correlating roughness and functionality?
  • [01:05:34] How many of the examples shown are compliant with ISO 25178?