Automated Workflows for XRD & XRR
X-ray diffraction and reflectometry have become routine measurements. From checking for impurities and phase percentages in powders to assessing thin film quality and thickness, measurements are often carried out in an automated fashion to support high throughput research and production. For thin film samples, an additional challenge is ensuring the sample surface is properly positioned in the diffractometer for each measurement. The DIFFRAC.SUITE software package features many tools to set up these automated workflows. During this episode of Live from the Lab, we discuss the automation of jobs and sample alignment for both D6 and D8 X-ray diffractometers.
Broadcast live from Bruker's YouTube channel once each month, our Live from the Lab streaming series explores X-ray Diffraction, X-ray Microscopy, and Elemental Analysis topics, with advice from applications experts who also answer questions that come in during the show. Be sure to subscribe to our YouTube channel so you never miss an episode!