Metal coatings are essential to many industrial sectors by providing enhanced surface properties to a wide variety of products. The metal coatings can provide a durable, corrosion-resistant layer to protect the base material, and help to minimize the wear and tear of metallic products. Metallic coatings can improve electrical conductivity, resistance to torque, solderability among other things. The quality control of composition and thickness of coatings is critical to ensure the correct coating properties and durability.
When tight quality control of metal coatings is required, X-ray fluorescence (XRF) analysis is the best overall solution. The Bruker M1 MISTRAL micro-XRF instrument can provide simultaneous coating thickness and coating composition measurements. In addition to coating analysis, the M1 MISTRAL can also measure the chemical composition of metal alloys, plating bath liquids, plastics and many other materials.
The M1 MISTRAL is equipped with a high-performance silicon drift detector (SDD), W or Rh microfocus X-ray tube and user-selectable collimator which allows adjustment of measurement spot size from 1.5 mm down to 100 µm. Together with the video microscope and motorized and programmable XYZ stage, the user can ensure that measurement takes place at exactly the desired spot.
M1 MISTRAL provides the following benefits for coating analysis:
Potential M1 MISTRAL coating thickness applications range from single-layer measurements such as Au on Cu to complex multi-layer alloy coatings.