High Resolution Diffraction (M/T)
This training course will show the theoretical fundamentals and data collection strategies for high resolution X-ray diffraction with the D8 family of diffractometers. The main focus is on the analysis of epitaxial thin films using the DIFFRAC.SUITE software packages including DIFFRAC.LEPTOS H.
- August 21 - 22, 2023
- October 30 - 31, 2023
Further Information
Location
Language
English
Class size
Because our trainings are interactive and learner-oriented, we limit class size to a maximum of four participants. Early enrollment is encouraged as registrations are accepted on a first-come/first-serve basis. We reserve the right to cancel a course and will notify participants four weeks prior to the start date if the course is cancelled.
*Each participant will be provided with class materials and lunch daily.
Attendance fee
The course fee is $1,870 USD per attendee per two-day session.
Contact
For further information about the course content, please contact:
Ben Krueger
Applications Scientist, XRD
For information about price, registration, or other questions:
Melanie Swanson
Marketing Specialist
For a quotation, please contact: